HILLSBORO, Ore.--(BUSINESS WIRE)--FEI (Nasdaq: FEIC) today introduced its latest and most powerful scanning electron microscope (SEM), the Nova NanoSEM™ 30 series. This high-end versatile field emission SEM series features new low kV performance for enhanced surface characterization, high current for compositional analysis capabilities and the world’s only high resolution operation in low vacuum to characterize uncoated and even insulating samples.
