ALBUQUERQUE, N.M.--(BUSINESS WIRE)--At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS. The original ORION instrument, introduced almost exactly one year ago, demonstrated that Helium ion microscopy has a uniquely powerful set of features that allow scientists to see things never before visible. And now it’s even better.
