ZEISS announces it will be highlighting a wide range of precision microscopes, imaging solutions, and software at M&M 2015, the Microscopy & Microanalysis 2015 Meeting, which will be held August 2-6, 2015 at the Oregon Convention Center in Portland, Oregon. On display at Booth #638 will be the ZEISS GeminiSEM field emission scanning electron microscope (FE-SEM), ZEISS Atlas 5 Array Tomography, and Airyscan, which pushes sensitivity beyond the limits of all conventional confocals.
Stop by to see the ZEISS GeminiSEM field emission scanning electron microscope, the ideal field emission SEM for high contrast, low voltage images. Image effortlessly with sub-nanometer resolution and high detection efficiency, even at higher pressures. GeminiSEM 500 comes with a novel Gemini optical design to deliver better resolution, especially at low voltage.
Also on display is Atlas 5 Array Tomography, a unique, easy-to-use hardware and software package for your electron microscope that uses advanced Atlas functionalities and a workflow oriented user interface to guide users through all imaging tasks. Specifically designed for automated imaging necessary in an array tomography workflow, Atlas 5 Array Tomography can help image thousands of serial sections of biological tissue automatically to enable 3D EM.
To learn how to revolutionize your confocal imaging, take a look at ZEISS Airyscan, which features a new detection concept that uses an array detector to oversample each Airy disk to gain sensitivity, resolution and speed for higher throughput. Unlike other superresolution techniques, Airyscan capitalizes on the scanning and optical sectioning capabilities of a confocal, capable of working with thicker samples that need a higher penetration depth.
Join us in our booth to discover new insights to your real world questions. Lunch and learn sessions and evening tutorials by our microscopy experts will offer the newest advances in confocal and field emission technology and demonstrate the next level of correlating microscopes in multiple dimensions.
Lunch and learn sessions:
Monday, August 3rd – 12:00-1:00 pm – GeminiSEM 500: More Detail, More Signal, More Flexibility
Tuesday, August 4th – 12:00-1:00 pm – Revolutionize Your Confocal Imaging with ZEISS Airyscan
Wednesday, August 5th – 12:00-1:00 pm – Introduction to the new ZEISS Sigma Family Evening tutorials:
Tuesday, August 4th – 5:45-6:45 pm – 3D Characterization and Correlation in Material Science
Wednesday, August 5th – 5:45-6:15 pm – Advances in 3D and Correlative Scanning Electron Microscopy
Wednesday, August 5th – 6:15-6:45 pm – 6:45 PM – High-Throughput SEM via Multi-Beam SEM
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