CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces the winners of its Nanotechnology Test & Measurement Applications Contest. Keithley teamed up with the editors of R&D Magazine, who selected three winners amongst entries that were received from as far away as Singapore. First place ($2500) has been awarded to Dr. Simon Prussin and Jason Reyes of the UCLA Dept. of Electrical Engineering, second place ($1500) to Rahul Gupta of the University of Delaware (Newark), and third place ($1000) to Ryan Major and David Vodnick of Hysitron, Inc. in Minneapolis. The contest objective was to foster development and propagation of improved test techniques to advance nanotech measurement art. Researchers who submitted entries are making complex and advanced measurements for applications as diverse as characterization of carbon nanotubes, electrical contact resistance, electrode spacing via atomic layer deposition, characterization of semiconductor junctions, and studies of nanoscale electrochemical modification in electronic devices.
