BOSTON--(BUSINESS WIRE)--Bruker Corporation (NASDAQ: BRKR) announced today at the Materials Research Society (MRS) Fall 2010 Meeting the release of a new generation of Atomic Force Microscopy (AFM) modes and measurement modules that transform Bruker’s AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. The most significant of these new AFM accessories, the PeakForce TUNA™ module, enables very high resolution nanoelectrical characterization on fragile samples, including organic photovoltaics, lithium ion battery composites, and carbon nanotube–based device structures. Complementing this capability, Bruker’s new offering for electrochemistry research provides wide solvent compatibility, ppm-level environmental control, and easy in-situ liquid scanning on an AFM.
