SANTA BARBARA, Calif.--(BUSINESS WIRE)--Bruker today announced the innovative and unique Dimension FastScanTM Atomic Force Microscope (AFM), which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to work hundreds of times faster than is possible with other commercial AFM systems, delivering results in seconds or minutes instead of hours or days. The FastScan system sets the new gold standard for performance and productivity in large-sample, atomic scale imaging across the scientific, biological, semiconductor, data storage and energy research markets.
