CHICAGO--(BUSINESS WIRE)--Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, was honored recently with a prestigious R&D 100 Award for one of the 100 most technologically significant new products in 2008. R&D Magazine recognized Carl Zeiss SMT’s new ORION™ Helium-Ion-Microscope for its ability to produce images showing features never seen before. For example, the ORION system can differentiate clearly between materials within semiconductor device cross sections, even in the case of extremely thin layers consisting of only a few atoms. And, as another example, the ORION instrument allows precise imaging and measuring of carbon nanotubes, the building blocks of the new world of nanotechnology.
