Bruker AXS Inc. Microanalysis Announces European Launch of Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash® Silicon Drift Detectors and Advanced Particle Analysis Software at EMC 2008

AACHEN, Germany--(BUSINESS WIRE)--At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis.