Thermo Fisher Scientific, the world leader in serving science, today announced the Thermo Scientific Phenom Pharos G2 Desktop Field Emission Gun - Scanning Electron Microscope (FEG-SEM) designed to increase access to advanced nanomaterial research capabilities.
HILLSBORO, Ore., July 15, 2021 /PRNewswire/ -- Thermo Fisher Scientific, the world leader in serving science, today announced the Thermo Scientific Phenom Pharos G2 Desktop Field Emission Gun - Scanning Electron Microscope (FEG-SEM) designed to increase access to advanced nanomaterial research capabilities. The new instrument makes it possible for customers to use a tabletop microscope to intuitively characterize the size, shape and chemical composition of a wide range of nanoparticles at high resolution. Using the Phenom Pharos G2, materials scientists can resolve the morphology of nanomaterials in materials like metals, minerals and ceramics at 2.0 nanometer (nm) resolution at 20 kilovolts (kV), paving the way to achieve advances in manufacturing, electronics, clean energy and other applications. Researchers can also image soft, beam-sensitive or insulating samples at energy levels as low as 1 kV, obtaining high-resolution views into polymers and multilayer organic films without damaging or obscuring their nanoscale features. “The Phenom Pharos G2 progresses nanomaterial research by delivering high resolutions and a wide acceleration voltage range, all in a desktop system that can fit within a lab or office,” said Rosy Lee, vice president and general manager of materials science at Thermo Fisher. “From more advanced textiles and food packaging to improved solar and wind energy, this easy-to-use instrument supports rapid innovation for a wide range of industries.” The Phenom Pharos G2 is intuitive to operate and highly productive, making it a versatile instrument for high-volume industrial and academic labs. The benefits include:
To learn more about the Thermo Scientific Phenom Pharos G2 FEG-SEM, visit https://ter.li/fvrj2h. About Thermo Fisher Scientific Media Contact Information:
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