RESEARCH TRIANGLE PARK, N.C.--(BUSINESS WIRE)--Semiconductor Research Corporation (SRC), the world's leading university-research consortium for semiconductors and related technologies, and researchers from Cornell University today announced a reliable method for visualizing and identifying the detailed structure of low-k insulating materials at a sub-nanometer scale. The ability to capture direct, quantitative images of pore structures – some smaller than one nanometer – helps solve semiconductor scaling concerns that could affect the future performance and power usage of integrated circuits.
