HILLSBORO, Ore., Feb. 14, 2011 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC), a leading instrumentation company that provides imaging and analysis systems for research and industry, today announced a novel solution for analyzing the production characteristics and potential of unconventional gas reservoirs. The Helios NanoLab™ DualBeam™ system images kerogen, porosity and microstructures in three dimensions (3D) with nanometer-scale resolution. The data are essential to determining the production potential of the reservoir, optimizing extraction procedures and designing simulators of the nanoscale pore structure.
