HILLSBORO, Ore., Sept. 12 /PRNewswire-FirstCall/ -- FEI Company (Nasdaq: FEIC - News) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern’s particle image analysis software on FEI’s line of Quanta(TM) scanning electron microscopes (SEMs). The combination delivers a powerful particle analysis solution that extends current analysis technologies for nano-sized particles.
