BOSTON--(BUSINESS WIRE)--During the 2006 Materials Research Society Fall Meeting now taking place at the Hynes Convention Center, Bruker AXS, a leading global provider of advanced X-ray solutions for life and advanced materials sciences, announced the recipients of its 2006 Excellence in X-ray Diffraction (XRD) scholarships based on unique experiments performed by advanced university students. Recognizing academic achievement in X-ray Diffraction, Bruker AXS presented a $5,000 scholarship for unique applications in the category of Materials Science and another $5,000 scholarship for the category of Geology and Chemistry. The winners were selected by an independent panel of judges: Dr. Tom Blanton from Eastman Kodak, Dr. Jim Kaduk from Innovene and President of the International Centre for Diffraction Data, Professor Richard Matyi, College of Nanoscale Science and Engineering at UAlbany-SUNY, National Research Council Canada Research Officer Dr. Pam Whitfield, Associate Professor Scott Misture from Alfred University in New York, and Dr. Nattamai Bhuvanesh, Department of Chemistry at Texas A&M University.
