FEI Company and Malvern Instruments Release Advanced Particle Characterization System

PORTLAND, Ore.--(BUSINESS WIRE)--FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd. (Malvern, UK) have released Quanta Morphologi, a powerful new solution combining the performance of FEI’s Quanta FEG scanning electron microscope and Malvern’s proven Morphologi particle characterization software. For the first time ever, Quanta Morphologi users, including pharmaceutical quality control method development labs, will have direct analysis methods to obtain both size and shape information on sub-micron particles.
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