SANTA BARBARA, Calif.--(BUSINESS WIRE)--Bruker today announced the release of its second-generation Inspire™ infrared (IR) nanocharacterization system, which features 10-nanometer spatial resolution infrared chemical mapping in an easy-to-use, laser-safe package. With IR EasyAlign™, Inspire simplifies scattering scanning near-field optical microscopy (sSNOM), a powerful technique for identifying chemical composition at the nanoscale. For the first time, the highest resolution nanoscale chemical mapping now becomes widely accessible. The system expands upon Bruker’s exclusive PeakForce Tapping® technology to provide new information for graphene research, polymers, complex materials and thin films, instantly correlating chemical maps with sample properties, such as modulus, conductivity, and workfunction. Inspire accomplishes all of this at the highest spatial resolution, making it an exceptionally powerful and versatile nanochemical characterization system.
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