Carl Zeiss Meditec AG Releases: Novel Technique for Characterization of Monolayer Segregation
Published: Jun 01, 2010
NANTES, France & OBERKOCHEN, Germany--(BUSINESS WIRE)--Scientists at the University of Nantes (France) have recently developed a novel technique to detect and quantify grain boundary segregations using wavelength dispersive X-ray spectroscopy (WDS). The instrument basis for the development of this new technique is the MERLIN® Field Emission Scanning Electron Microscope from Carl Zeiss, equipped with an Oxford WDS spectrometer. The experiment was performed at the Laboratoire de Génie des Matériaux et Procédés Associés Polytech´ Nantes (LGMPA).