BILLERICA, Mass.--(BUSINESS WIRE)--Bruker (NASDAQ: BRKR) today announced the release of Inspire™, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial resolution in chemical and materials property mapping. The new and unique Inspire system incorporates Bruker’s proprietary PeakForce IR™ mode to enable nanoscale infrared reflection and absorption mapping for a wide range of applications, including the characterization of microphases and their interfaces in polymer blends, plasmons in the two-dimensional electron gas of graphene, and chemical heterogeneity in complex materials and thin films.
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