Xradia Delivers Hard X-ray Nanoprobe Microscope to Argonne National Laboratory
Published: Jun 29, 2007
CONCORD, Calif. & ARGONNE, Ill.--(BUSINESS WIRE)--Xradia, Inc., a developer and manufacturer of ultra-high-resolution x-ray imaging systems for 3D tomography and nanotechnology applications, today announced the delivery of the first hard x-ray Nanoprobe instrument, which has been developed together the Argonne National Laboratory’s Center for Nanoscale Materials (CNM). The hard x-ray Nanoprobe (NPI) delivers an unprecedented high resolution better than 30nm for elemental and structural analysis using scanning probe and full-field transmission x-ray microscopy. The NPI has been installed at the Hard X-ray Nanoprobe Beamline (ID-26) at Argonne’s Advanced Photon Source (APS).