Spheryx Publishes Results On Semiconductor Polishing Slurries In Applied Physics L

Published: Oct 12, 2017

NEW YORK, Oct. 12, 2017 /PRNewswire/ -- Spheryx announces the publication of an article entitled "Holographic characterization of colloidal particles in turbid media" in the peer-reviewed journal, Applied Physics Letters, which can be found at http://scitation.aip.org/content/aip/journal/apl/111/15/10.1063/1.4999101. The work was a collaboration of Fook Chiong Cheong, Priya Kasimbeg, David B. Ruffner, Ei Hlaing, Jaroslaw M. Blusewicz and Laura A. Philips of Spheryx, Inc., and Professor David G. Grier of New York University. The paper demonstrates that Spheryx's proprietary Total Holographic Characterization® is an effective method for quantitatively detecting, counting and characterizing large particle contaminants in nanoparticle semiconductor polishing slurries. Dr. Laura Philips, President and CEO of Spheryx stated, "This paper demonstrates that Spheryx's Total Holographic Characterization® is an invaluable tool for monitoring the quality of semiconductor slurries. Reducing large particle contaminants in slurries can improve yields and decrease costs in semiconductor manufacturing."

Solutions for Suspensions (PRNewsFoto/Spheryx, Inc.)

About Spheryx, Inc.
Spheryx, Inc. is a privately held analytical services and instruments company providing Total Holographic Characterization® of colloidal materials. Spheryx's proprietary technology uses holographic video microscopy to characterize each particle in colloidal dispersions and multi-component colloidal mixtures, offering unprecedented insights into these materials' characteristics. Applications include R&D, quality assurance and manufacturing process control across a broad spectrum of industries, where characterization of colloids can enhance innovation, improve safety and reduce costs. For more information: https://www.spheryx.solutions/

Note: This news release contains forward-looking statements regarding future events. These statements are just predictions and are subject to risks and uncertainties that could cause the actual events or result to differ materially.

Laura Philips, CEO

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SOURCE Spheryx, Inc.

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