FEI Company Joins SEMATECH on Metrology Research at UAlbany NanoCollege

Published: Jul 13, 2009

ALBANY, N.Y. & HILLSBORO, Ore.--(BUSINESS WIRE)--FEI Company, (NASDAQ: FEIC), a leading provider of atomic-scale imaging and analysis systems, and SEMATECH, the global consortium of chipmakers, announced today that FEI Company has joined SEMATECH’s Advanced Metrology Development Program at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany. The collaboration will expand on current joint efforts for the development of novel technologies to enable improved process control and yield.

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