Bruker Corporation Releases AFM Zoom Option for 3D Optical Microscopes
Published: Nov 26, 2012
BOSTON--(BUSINESS WIRE)--Bruker announced today at the 2012 Materials Research Society (MRS) Fall Meeting the release of the unique NanoLens™ Atomic Force Microscope (AFM) accessory for ContourGT® 3D optical microscopes. Designed for fast installation on a new five-position, fully automated turret, the compact NanoLens delivers unprecedented high-resolution imaging capabilities without sacrificing measurement speed in optical modes. With NanoLens, users can perform nanometer-scale surface and material property analysis on the same system that provides the industry’s most repeatable and versatile 3D optical microscopy measurements.