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FEI Company Announces New Verios Extreme High Resolution SEM  
7/30/2012 9:42:23 AM

HILLSBORO, Ore., July 30, 2012 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC), a leading instrumentation company providing imaging and analysis systems for research and industry, extends its leadership in the high-resolution scanning electron microscopy (SEM) market with the launch of the new Verios™ XHR SEM. The Verios provides the sub-nanometer resolution and enhanced contrast needed for precise measurements on beam-sensitive materials in advanced semiconductor manufacturing and materials science applications.
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