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LeCroy Corporation Introduces the SDA 7 Zi Oscilloscope with SDA II—The Next Generation of Serial Data Analysis
10/2/2008 9:15:18 AM
CHESTNUT RIDGE, N.Y.--(BUSINESS WIRE)--LeCroy’s SDA 7 Zi Oscilloscope with SDA II redefines serial data analysis in an oscilloscope. While many oscilloscopes measure compliance, LeCroy’s SDA II goes beyond compliance testing with the introduction of five new debugging methodologies that 1) visually predict Bit Error Rate directly on the eye, 2) provide dual methods of decomposing jitter that are presented both numerically and with insightful displays, 3) provide Quick-View, for intuitive combination eye and jitter breakdown master display, 4) measure millions of unit intervals at speeds up to 50 times faster than any other oscilloscope, and 5) integrate both compliance testing and SDA II debugging tools for complete drill down to find the source of the failure. For compliance testing, LeCroy’s QualiPHY™ provides the best available automated compliance solution that configures and documents standardized tests. However, when a design fails a compliance test, the engineer needs an advanced set of tools to identify and solve those problems, and no other set of tools can match LeCroy’s SDA 7 Zi Oscilloscope with SDA II.
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