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FEI Company Receives Award for Titan S/TEM at Nano Tech 2008 in Japan


3/19/2008 10:21:33 AM

PORTLAND, Ore.--(BUSINESS WIRE)--FEI Company (Nasdaq: FEIC) today announced that its Titan™ 80-300 S/TEM (scanning/transmission electron microscope), the world’s most powerful commercially available microscope, was honored with the award for technical excellence in evaluation and measurement at Nano Tech 2008, February 13-15 in Tokyo, Japan. The award recognizes both innovative technology and the contributions the Titan S/TEM has enabled in nanotechnology research.

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