FEI Company Introduces the New Tecnai Femto Ultrafast Electron Microscope

HILLSBORO, Ore., Oct. 29, 2013 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC) today released the Tecnai™ Femto ultrafast electron microscope (UEM), enabling scientists to explore ultrafast events and processes that occur at the atomic and molecular spatial scale over time spans measured in femtoseconds (10-15 seconds). These include such fundamental processes as the absorption of light energy and its transformation into heat or mechanical changes (photoactuation) and the crystallization or recrystallization of materials--including large biological molecules for structural analysis. The Tecnai Femto is the first system to commercialize the patented ultrafast electron microscopy technology pioneered by Nobel laureate Prof. Ahmed Zewail at the California Institute of Technology. The first Tecnai Femto UEM will be installed at the University of Minnesota in November 2013.

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