Bruker Corporation Introduces New Value Standard With Scalable Microscope for Combined Optical Surface Metrology and Imaging
3/5/2013 9:49:47 AM
TUCSON, Ariz.--(BUSINESS WIRE)--Bruker today announced the launch of the new, scalable ContourGT-K 3D optical microscope for value-oriented, uncompromised bench-top metrology. Incorporating many of the advanced features of Bruker’s flagship optical metrology products, the ContourGT-K delivers unsurpassed Z-axis resolution across all fields of view and superior 2D/3D imaging capability for non-contact profile, roughness and thickness measurements on a wide range of surfaces. The system’s gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments. The new ContourGT-K also incorporates the latest version Bruker Vision64™ software and the most extensive library of pre-programmed filters and analyses for easy access to advanced measurements for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications.
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