News | News By Subject | News by Disease News By Date | Search News
Get Our FREE
Industry eNewsletter
email:    
   

Bruker AXS Inc. (BAXS) Microanalysis Announces European Launch of Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash® Silicon Drift Detectors and Advanced Particle Analysis Software at EMC 2008


9/2/2008 11:19:24 AM

AACHEN, Germany--(BUSINESS WIRE)--At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis.

Read at BioSpace.com


comments powered by Disqus
   

ADD TO DEL.ICIO.US    ADD TO DIGG    ADD TO FURL    ADD TO STUMBLEUPON    ADD TO TECHNORATI FAVORITES